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Published by: James Yang

Deferred Examination Considered by U.S. Patent Office

On February 12, 2009, the Patent Office hosted a roundtable discussion on “deferred examination” which would permit applicants to defer examination of a patent application. Currently, the U.S. Patent Office examines patent applications on a first-come, first-served basis for all patent applications. In other foreign countries, patent applicants are allowed to defer examination until the applicant requests examination. The Patent Office held the roundtable to obtain feedback from U.S. stakeholders on whether deferred examination would be beneficial to them.

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Deadline to Submit Comments on the Proposed Patent Rule Changes is May 3, 2006

The deadline to submit comments regarding the proposed patent rule changes is May 3, 2006. The changes relate to claiming practices and continuation practice which may limit the scope of your patent. These proposed changes have real life impact on patents and how businesses will procure and use patents in the future. The proposed rule [...]

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